JPH086287Y2 - 光学的特性測定装置 - Google Patents

光学的特性測定装置

Info

Publication number
JPH086287Y2
JPH086287Y2 JP11458490U JP11458490U JPH086287Y2 JP H086287 Y2 JPH086287 Y2 JP H086287Y2 JP 11458490 U JP11458490 U JP 11458490U JP 11458490 U JP11458490 U JP 11458490U JP H086287 Y2 JPH086287 Y2 JP H086287Y2
Authority
JP
Japan
Prior art keywords
measured
reference plate
dirt
backing plate
recess
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP11458490U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0429865U (en]
Inventor
政一郎 清部
豊 齋藤
幸彦 高松
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP11458490U priority Critical patent/JPH086287Y2/ja
Publication of JPH0429865U publication Critical patent/JPH0429865U/ja
Application granted granted Critical
Publication of JPH086287Y2 publication Critical patent/JPH086287Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Optical Measuring Cells (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP11458490U 1990-05-11 1990-10-31 光学的特性測定装置 Expired - Lifetime JPH086287Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11458490U JPH086287Y2 (ja) 1990-05-11 1990-10-31 光学的特性測定装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2-49214 1990-05-11
JP4921490 1990-05-11
JP11458490U JPH086287Y2 (ja) 1990-05-11 1990-10-31 光学的特性測定装置

Publications (2)

Publication Number Publication Date
JPH0429865U JPH0429865U (en]) 1992-03-10
JPH086287Y2 true JPH086287Y2 (ja) 1996-02-21

Family

ID=31890083

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11458490U Expired - Lifetime JPH086287Y2 (ja) 1990-05-11 1990-10-31 光学的特性測定装置

Country Status (1)

Country Link
JP (1) JPH086287Y2 (en])

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5920667U (ja) * 1982-07-30 1984-02-08 株式会社日立製作所 プリント配線板用ブスバ−
JPH0184048U (en]) * 1987-11-26 1989-06-05

Also Published As

Publication number Publication date
JPH0429865U (en]) 1992-03-10

Similar Documents

Publication Publication Date Title
US5073712A (en) Light scanner web profile measurement apparatus and method
JP2008164477A (ja) 走査式測距装置の光学窓汚れ検出装置
JPH0723868B2 (ja) 走行路表面状態を検出する方法
JPH0786470B2 (ja) ディスク表面検査方法及び装置
JP3940650B2 (ja) 皮脂量測定装置及び肌用観察装置
JP3451536B2 (ja) 土壌の光学特性測定装置
JPH086287Y2 (ja) 光学的特性測定装置
US6528790B2 (en) Method and apparatus for detecting water on a surface of an object
JPH0346524A (ja) 色彩計
JP2965916B2 (ja) メータリング装置の設定のための方法及び装置
JPH0317378B2 (en])
JP3380321B2 (ja) 表面検査装置
JPH0658323B2 (ja) 水のｃｏｄ測定装置
US5373365A (en) Apparatus and method for measuring particle contamination
JPH0777492A (ja) 吸光光度計およびこの吸光光度計の自己診断方法
JP3153503B2 (ja) 液体供給量測定システム
SU364877A1 (ru) Анализатор дисперсности гетерогенных систем
JP3694754B2 (ja) 基準反射体の汚れ検出方法、反射率測定装置、および記憶媒体
JP2000199731A (ja) 光学特性測定装置及びその光学特性測定装置を備える成膜装置
JPH0419494Y2 (en])
JPH0714804Y2 (ja) レーザ干渉式デポレートモニタ
JPH0353161Y2 (en])
EP0130797B1 (en) Method of inspecting the surface of photographic paper
JPH08271417A (ja) オイル劣化度測定装置
JPH0729445Y2 (ja) 透明物体厚さ測定装置